cURL Error Code: 7 cURL Error Message: Failed to connect to 127.0.0.1 port 9200: Connection refused cURL Error Code: 7 cURL Error Message: Failed to connect to 127.0.0.1 port 9200: Connection refused Advantest Pioneers a New Era of AI-Powered Semiconductor Testing - OurCoders (我们程序员)

Advantest Pioneers a New Era of AI-Powered Semiconductor Testing

2025-10-06 07:00:00 英文原文

作者:Advantest America, Inc. Mon, October 6, 2025 at 1:00 AM MDT 3 min read

Advantest America, Inc.

Advantest America, Inc.

Test Leader Taps the Power of NVIDIA’s Machine Learning Technology

SAN JOSE, Calif., Oct. 06, 2025 (GLOBE NEWSWIRE) -- Advantest America, a leader in semiconductor test solutions, today announced it is reinventing semiconductor testing with the power of real-time artificial intelligence (AI).

Advantest is combining advanced machine learning (ML) from NVIDIA (NASDAQ: NVDA) with the Advantest Cloud Solutions Real-Time Data Infrastructure (ACS RTDI™) to drive a shift from traditional test workflows to adaptive AI-driven systems. NVIDIA has selected ACS RTDI for high-volume production to power its latest AI-enabled applications for Blackwell and next-generation devices —aiming to deliver breakthrough efficiency, reduced costs, and improved yields.

Transforming Test into Intelligence

Testing has long been the cornerstone of chip manufacturing, ensuring every device meets exacting standards of quality and performance. Traditionally, this required weeks of data collection, fault analysis, and test deployment cycles. ACS RTDI moves testing from validation to prediction—transforming semiconductor production into an AI-driven, continuously adaptive process.

Integrated with NVIDIA AI inference, ACS RTDI could bring real-time intelligence to semiconductor testing. For NVIDIA Blackwell and future devices, massive data streams are ingested through ACS Data-Feed-Forward cross-insertion, where GPU-accelerated compute optimizes the test set for every chip. This scalable GPU architecture expands seamlessly, supporting the concurrent training of multiple ML models—enabling non-stop operation to drive yield gains, dynamically optimized test coverage, and sharp reductions in latency, power, and cost.

Scaling AI Across Production
ACS RTDI has demonstrated its robustness at high-volume production sites worldwide, securely supporting AI/ML-driven test automation across diverse applications. Its flexible architecture —separating data preparation, algorithms, and decisioning—empowers manufacturers to rapidly adapt as production needs evolve.

“Integrating NVIDIA AI inference into high-volume production demonstrates the transformative potential of ACS solutions,” said Michael Chang, vice president and general manager of ACS at Advantest. “Together, we are accelerating the fusion of compute and data, paving the way for a new era of semiconductor testing that is adaptive, scalable, and intelligence-driven.”

Building the AI-Driven Test Facility of the Future

Advantest also plans to incorporate NVIDIA’s NeMo and NVIDIA NIM microservices into ACS semiconductor test analytics solutions. These technologies will curate heterogeneous production data, evaluate models, and deploy AI agents capable of running generative AI applications directly in the test environment.

关于《Advantest Pioneers a New Era of AI-Powered Semiconductor Testing》的评论


暂无评论

发表评论

摘要

Advantest America is integrating NVIDIA's machine learning technology with its Advantest Cloud Solutions Real-Time Data Infrastructure (ACS RTDI) to revolutionize semiconductor testing. This collaboration aims to enhance efficiency, reduce costs, and improve yields for high-volume production by transforming traditional test workflows into adaptive AI-driven systems. The integration enables real-time intelligence in testing through GPU-accelerated computing, supporting continuous adaptation and scalability across diverse applications. Advantest also plans to incorporate NVIDIA’s NeMo and NIM microservices into its semiconductor test analytics solutions to further enhance AI capabilities directly within the testing environment.

相关新闻

相关讨论